Federal Register: March 2, 2006 (Volume 71, Number 41)
DOCID: FR Doc E6-2988
DEPARTMENT OF COMMERCE
International Trade Administration
NOTICE: NOTICES
ACTION: Applications, hearings, determinations, etc.:
SUBJECT CATEGORY:
Applications for Duty-Free Entry of Scientific Instruments
DOCUMENT SUMMARY:
Pursuant to section 6(c) of the Educational, Scientific and Cultural
Materials Importation Act of 1966 (Pub. L. 89651; 80 Stat. 897; 15 CFR
part 301), we invite comments on the question of whether instruments of
equivalent scientific value, for the purposes for which the instruments
shown below are intended to be used, are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations
and be filed within 20 days with the Statutory Import Programs Staff,
U.S. Department of Commerce, Washington, DC 20230. Applications may be
examined between 8:30 a.m. and 5 p.m. in Suite 4100W, U.S. Department
of Commerce, Franklin Court Building, 1099 14th Street, NW., Washington, DC.
Docket Number: 05059. Applicant: College of Staten Island, 2800
Victory Blvd., Staten Island, NY 10314. Instrument: Plasma System.
Manufacturer: Diener Electronic GmBh & Co., KG, Germany. Intended Use:
The instrument is intended to be used to study and develop:
1. Nanotechnolgy with focused ion beams, including electronic
properties of carbon nanowires direct written with nanoscaled ion beams on carbonaceous substrates
2. Micro and nanoscale light emitting diodes on diamond, with the aim to develop single molecule and single
[[Page 10650]]
photon electrically driven light sources operating at room temperature
3. Development of highpressure, hightemperature diamond anvil cells
with internally heated anvils for hydrothermal and and shear stress experiments.
The instrument will also be used in courses on materials
science.Application accepted by Commissioner of Customs: December 20,2005.
Docket Number: 06002. Applicant: The University of Puerto Rico at
Mayaguez, Dept. Of Chemistry, Mayaguez, Puerto Rico 00680 Instrument:
Electron Microscope, Model JEM2010 Manufacturer: JEOL Ltd., Japan.
Intended Use: The instrument is intended to be used for experimental studies including the characterization of gold and silver
nanostructures, structureproperty relations in semiconductor
nanoparticles, nanowire formations and nanorods, structural fuel cell performance and the catalytic activity of Pt, Ru and PtRu
nanostructures, and the structure of functionalized organicbased
nanofibers. The instrument will also be used in a variety of courses.
Application accepted by Commissioner of Customs: January 20,2006.
Docket Number: 06003. Applicant: Oklahoma State University, 203
Whitehurst, Stillwater, OK 740483011. Instrument: Electron Microscope,
Model JEM2100F. Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument is intended to be used for studies including:
1. Decomposed metal complexes at low temperatures which yield
nanocrystalline products that are useful catalysts, electrode materials
for batteries and supercapacitors, corrosion inhibitors, photovoltaics, and sorbants for pollutants.
2. Semiconducting nanoparticles (as small as 2 nm), single wall
nanotubes and the electrical conductivity of either a semiconductor or
a metal, depending on the diameter and helicity of the tube.
3. Virusvector interactions in several important plant disease
inducing viruses, that are vectored by fungi, for understanding emerging diseases in plants.
It will also be used for graduate student training in electron
microscopy. Application accepted by Commissioner of Customs: January 23, 2006.
Docket Number: 06004. Applicant: University of North Texas, Department
of Materials Science and Engineering, 3940 N. Elm, Research Park Room
E132, Denton, TX 76203. Instrument: Mass Spectrometer, Model Nova 200
NanoLab. Manufacturer: FEI Company, The Netherlands. Intended Use: The
instrument is intended to be used in a central research facility for
studies in materials science, chemistry, biology and physics. For
example, in materials science and engineering, it will be used to study
shapememory metallic alloys, aluminum alloys for automotive uses, porous ceramic thin films and strained Si substrates for
microelectronic devices, polymer nanocomposites, characterization of
ion beamsolid interaction, optoelectronic thin films for solid state
lighting and photovoltaic applications, and ceramic materials for low
temperature solid oxide fuel cells. Application accepted by Commissioner of Customs: February 14, 2006.
Docket Number: 06005. Applicant: University of Maryland, Materials
Science and Engineering Department, Kim Building, Room 1237, College
Park, MD 20742. Instrument: Electron Microscope, Model JEM2100F.
Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument is
intended to be used to characterize nanomaterials and nanocomposites at
the atomic level. These include semiconductor nanostructures, polymeric
materials, metal nanoparticles, ferroelectric/ferromagnetic oxide
nanocomposites and semiconductor nanowires. Properties of materials
examined include crystal structure and quality of material, structural
defects, and morphology using techniques of electron diffraction, high
resolution lattice imaging, bright/dark field imaging and obtaining
electron diffraction patterns and images of areas as small as a few
nanometers in diameter. The instrument will also be used in courses and
for conducting individual graduate research projects. Application accepted by Commissioner of Customs: February 8, 2006.
Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. E62988 Filed 3106; 8:45 am]
BILLING CODE 3510DSS
SUMMARY:
University of Puerto Rico, Mayaguez, et al.,
DOCUMENT BODY 2:
Pursuant to section 6(c) of the Educational, Scientific and Cultural
Materials Importation Act of 1966 (Pub. L. 89651; 80 Stat. 897; 15 CFR
part 301), we invite comments on the question of whether instruments of
equivalent scientific value, for the purposes for which the instruments
shown below are intended to be used, are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations
and be filed within 20 days with the Statutory Import Programs Staff,
U.S. Department of Commerce, Washington, DC 20230. Applications may be
examined between 8:30 a.m. and 5 p.m. in Suite 4100W, U.S. Department
of Commerce, Franklin Court Building, 1099 14th Street, NW., Washington, DC.
Docket Number: 05059. Applicant: College of Staten Island, 2800
Victory Blvd., Staten Island, NY 10314. Instrument: Plasma System.
Manufacturer: Diener Electronic GmBh & Co., KG, Germany. Intended Use:
The instrument is intended to be used to study and develop:
1. Nanotechnolgy with focused ion beams, including electronic
properties of carbon nanowires direct written with nanoscaled ion beams on carbonaceous substrates
2. Micro and nanoscale light emitting diodes on diamond, with the aim to develop single molecule and single
[[Page 10650]]
photon electrically driven light sources operating at room temperature
3. Development of highpressure, hightemperature diamond anvil cells
with internally heated anvils for hydrothermal and and shear stress experiments.
The instrument will also be used in courses on materials
science.Application accepted by Commissioner of Customs: December 20,2005.
Docket Number: 06002. Applicant: The University of Puerto Rico at
Mayaguez, Dept. Of Chemistry, Mayaguez, Puerto Rico 00680 Instrument:
Electron Microscope, Model JEM2010 Manufacturer: JEOL Ltd., Japan.
Intended Use: The instrument is intended to be used for experimental studies including the characterization of gold and silver
nanostructures, structureproperty relations in semiconductor
nanoparticles, nanowire formations and nanorods, structural fuel cell performance and the catalytic activity of Pt, Ru and PtRu
nanostructures, and the structure of functionalized organicbased
nanofibers. The instrument will also be used in a variety of courses.
Application accepted by Commissioner of Customs: January 20,2006.
Docket Number: 06003. Applicant: Oklahoma State University, 203
Whitehurst, Stillwater, OK 740483011. Instrument: Electron Microscope,
Model JEM2100F. Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument is intended to be used for studies including:
1. Decomposed metal complexes at low temperatures which yield
nanocrystalline products that are useful catalysts, electrode materials
for batteries and supercapacitors, corrosion inhibitors, photovoltaics, and sorbants for pollutants.
2. Semiconducting nanoparticles (as small as 2 nm), single wall
nanotubes and the electrical conductivity of either a semiconductor or
a metal, depending on the diameter and helicity of the tube.
3. Virusvector interactions in several important plant disease
inducing viruses, that are vectored by fungi, for understanding emerging diseases in plants.
It will also be used for graduate student training in electron
microscopy. Application accepted by Commissioner of Customs: January 23, 2006.
Docket Number: 06004. Applicant: University of North Texas, Department
of Materials Science and Engineering, 3940 N. Elm, Research Park Room
E132, Denton, TX 76203. Instrument: Mass Spectrometer, Model Nova 200
NanoLab. Manufacturer: FEI Company, The Netherlands. Intended Use: The
instrument is intended to be used in a central research facility for
studies in materials science, chemistry, biology and physics. For
example, in materials science and engineering, it will be used to study
shapememory metallic alloys, aluminum alloys for automotive uses, porous ceramic thin films and strained Si substrates for
microelectronic devices, polymer nanocomposites, characterization of
ion beamsolid interaction, optoelectronic thin films for solid state
lighting and photovoltaic applications, and ceramic materials for low
temperature solid oxide fuel cells. Application accepted by Commissioner of Customs: February 14, 2006.
Docket Number: 06005. Applicant: University of Maryland, Materials
Science and Engineering Department, Kim Building, Room 1237, College
Park, MD 20742. Instrument: Electron Microscope, Model JEM2100F.
Manufacturer: JEOL Ltd., Japan. Intended Use: The instrument is
intended to be used to characterize nanomaterials and nanocomposites at
the atomic level. These include semiconductor nanostructures, polymeric
materials, metal nanoparticles, ferroelectric/ferromagnetic oxide
nanocomposites and semiconductor nanowires. Properties of materials
examined include crystal structure and quality of material, structural
defects, and morphology using techniques of electron diffraction, high
resolution lattice imaging, bright/dark field imaging and obtaining
electron diffraction patterns and images of areas as small as a few
nanometers in diameter. The instrument will also be used in courses and
for conducting individual graduate research projects. Application accepted by Commissioner of Customs: February 8, 2006.
Gerald A. Zerdy,
Program Manager, Statutory Import Programs Staff.
[FR Doc. E62988 Filed 3106; 8:45 am]
BILLING CODE 3510DSS