Federal Register: June 30, 2009 (Volume 74, Number 124)
DOCID: fr30jn09-36 FR Doc E9-15491
DEPARTMENT OF COMMERCE
International Trade Administration
NOTICE: NOTICES
DOCID: fr30jn09-36
ACTION: Antidumping:
SUBJECT CATEGORY:
Miami University, et al.
DOCUMENT SUMMARY:
Notice of Consolidated Decision on Applicationsfor DutyFree Entry of Electron Microscopes
This is a decision consolidated pursuant to Section 6(c) of the
Educational, Scientific, and Cultural Materials Importation Act of 1966
(Pub. L. 89651, as amended by Pub. L. 10636; 80 Stat. 897; 15 CFR
part 301). Related records can be viewed between 8:30 A.M. and 5:00
P.M. in Room 3705, U.S. Department of Commerce, 14th and Constitution Avenue., NW, Washington, D.C.
Docket Number: 09014. Applicant: Miami University, Oxford, OH 45056.
Instrument: Electron Microscope. Manufacturer: JEOL, Japan. Intended Use: See notice at 74 FR 23394, May 19, 2009.
Docket Number: 09018. Applicant: Texas A&M University, College
Station, TX 778434458. Instrument: Electron Microscope. Manufacturer:
FEI Company, Czech Republic. Intended Use: See notice at 74 FR 23394, May 19, 2009.
Docket Number: 09020. Applicant: Columbia University, New York, NY
10032. Instrument: Electron Microscope. Manufacturer: FEI Company, the
Netherlands. Intended Use: See notice at 74 FR 23394, May 19, 2009.
Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign
[[Page 31253]]
instrument, for such purposes as these instruments are intended to be
used, was being manufactured in the United States at the time the
instruments were ordered. Reasons: Each foreign instrument is an
electron microscope and is intended for research or scientific
educational uses requiring an electron microscope. We know of no
electron microscope, or any other instrument suited to these purposes,
which was being manufactured in the United States at the time of order of each instrument.
Dated: June 22, 2009.
Christopher Cassel,
Acting Director.
Subsidies Enforcement Office.
Import Administration.
[FR Doc. E915491 Filed 62909; 8:45 am]
BILLING CODE 3510DSS
SUMMARY:
Consolidated Decision on Applications for Duty-Free Entry of Electron Microscopes
DOCUMENT BODY 2:
Notice of Consolidated Decision on Applicationsfor DutyFree Entry of Electron Microscopes
This is a decision consolidated pursuant to Section 6(c) of the
Educational, Scientific, and Cultural Materials Importation Act of 1966
(Pub. L. 89651, as amended by Pub. L. 10636; 80 Stat. 897; 15 CFR
part 301). Related records can be viewed between 8:30 A.M. and 5:00
P.M. in Room 3705, U.S. Department of Commerce, 14th and Constitution Avenue., NW, Washington, D.C.
Docket Number: 09014. Applicant: Miami University, Oxford, OH 45056.
Instrument: Electron Microscope. Manufacturer: JEOL, Japan. Intended Use: See notice at 74 FR 23394, May 19, 2009.
Docket Number: 09018. Applicant: Texas A&M University, College
Station, TX 778434458. Instrument: Electron Microscope. Manufacturer:
FEI Company, Czech Republic. Intended Use: See notice at 74 FR 23394, May 19, 2009.
Docket Number: 09020. Applicant: Columbia University, New York, NY
10032. Instrument: Electron Microscope. Manufacturer: FEI Company, the
Netherlands. Intended Use: See notice at 74 FR 23394, May 19, 2009.
Comments: None received. Decision: Approved. No instrument of equivalent scientific value to the foreign
[[Page 31253]]
instrument, for such purposes as these instruments are intended to be
used, was being manufactured in the United States at the time the
instruments were ordered. Reasons: Each foreign instrument is an
electron microscope and is intended for research or scientific
educational uses requiring an electron microscope. We know of no
electron microscope, or any other instrument suited to these purposes,
which was being manufactured in the United States at the time of order of each instrument.
Dated: June 22, 2009.
Christopher Cassel,
Acting Director.
Subsidies Enforcement Office.
Import Administration.
[FR Doc. E915491 Filed 62909; 8:45 am]
BILLING CODE 3510DSS